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Search for "time-resolved measurement" in Full Text gives 4 result(s) in Beilstein Journal of Nanotechnology.

Implementation of data-cube pump–probe KPFM on organic solar cells

  • Benjamin Grévin,
  • Olivier Bardagot and
  • Renaud Demadrille

Beilstein J. Nanotechnol. 2020, 11, 323–337, doi:10.3762/bjnano.11.24

Graphical Abstract
  • illumination source. In other words, in this test, pp-KPFM is not used to perform a time-resolved measurement as a function of Δt. It is rather used to monitor a SP at two different levels of illumination, namely in a dark state and under cw illumination. Neglecting noise, both configurations yielded identical
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Published 12 Feb 2020

Time-resolved universal temperature measurements using NaYF4:Er3+,Yb3+ upconverting nanoparticles in an electrospray jet

  • Kristina Shrestha,
  • Arwa A. Alaulamie,
  • Ali Rafiei Miandashti and
  • Hugh H. Richardson

Beilstein J. Nanotechnol. 2018, 9, 2916–2924, doi:10.3762/bjnano.9.270

Graphical Abstract
  • understand temperature-dependent reactions such as protein unfolding inside microjet/microdroplets and microfluidic systems. Keywords: electrospray; microjet; nanothermometry; temperature measurement; time-resolved measurement; upconverting nanoparticles; Introduction There is need and interest to non
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Published 21 Nov 2018

Active and fast charge-state switching of single NV centres in diamond by in-plane Al-Schottky junctions

  • Christoph Schreyvogel,
  • Vladimir Polyakov,
  • Sina Burk,
  • Helmut Fedder,
  • Andrej Denisenko,
  • Felipe Fávaro de Oliveira,
  • Ralf Wunderlich,
  • Jan Meijer,
  • Verena Zuerbig,
  • Jörg Wrachtrup and
  • Christoph E. Nebel

Beilstein J. Nanotechnol. 2016, 7, 1727–1735, doi:10.3762/bjnano.7.165

Graphical Abstract
  • diamond Schottky diode and to understand the underlying switching mechanisms, we performed a time-resolved measurement of NV-intensity during switching between the fluorescent (NV− and NV0) and nonfluorescent (NV+) states. To record the time evolution of the NV intensity during switching between NV− or
  • accumulation layer. Upon applying a reverse bias potential of +15 V, we detect a spectrum of NV0 emission (red spectrum). Upon applying a higher reverse bias potential (+20 V) we detect a spectrum of NV− emission (blue spectrum). Schematic setup for time-resolved measurement of NV-intensity. To record the time
  • two time constants for the process of discharging NV− to NV+, indicating a two-step process. Simultaneous measurement of NV− and NV0 intensity. A time-resolved measurement of NV− (red curve) and NV0 (black curve) intensity simultaneously during switching between NV− and NV+ shows that the charging and
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Published 16 Nov 2016

Observation and analysis of structural changes in fused silica by continuous irradiation with femtosecond laser light having an energy density below the laser-induced damage threshold

  • Wataru Nomura,
  • Tadashi Kawazoe,
  • Takashi Yatsui,
  • Makoto Naruse and
  • Motoichi Ohtsu

Beilstein J. Nanotechnol. 2014, 5, 1334–1340, doi:10.3762/bjnano.5.146

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  • -resolved measurement of reflectance To analyze in detail the spectral changes occurring with laser-induced degradation due to continuous irradiation with laser light having an energy density below the LIDT, as confirmed in the previous section, we conducted an experiment to evaluate the time-resolved
  • side as the degradation proceeded. We estimated the origin of the 2nd peaks were Raman signals of degraded silica and this result represented the compositional changes in the molecular proceeds with the laser-induced degradation proceeded. 2 Analysis of degradation via pump–probe method 2.1 Time
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Published 21 Aug 2014
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